Use Cases and Applications

Advanced Stroboscopic Event Detection in Semiconductor Wafer Polishing

Advanced Stroboscopic Event Detection in Semiconductor Wafer Polishing

StroboX’s advanced technology, capable of identifying multiple stroboscopic events within the same image, provides a significant advantage in semiconductor wafer polishing. This capability allows for the simultaneous detection of various types of defects and irregularities across the wafer surface in real-time.

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High-Speed Semiconductor Manufacturing Inspection

High-Speed Semiconductor Manufacturing Inspection

StroboX leverages AI and stroboscopic technology to automate the inspection of high-speed semiconductor manufacturing processes. It synchronizes with production speeds to capture clear, high-resolution images and detect defects in real-time.

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High-Speed Textile Fabric Inspection

High-Speed Textile Fabric Inspection

StroboX employs AI and stroboscopic technology to automate the inspection of high-speed textile fabric production lines. It synchronizes with production speeds to capture clear images and detect defects in real-time.

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High-Speed Food Processing and Packaging Inspection

High-Speed Food Processing and Packaging Inspection

StroboX employs AI and stroboscopic technology to automate the inspection of high-speed food processing and packaging lines. It synchronizes with production and packaging speeds to capture clear images and detect defects in real-time.

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