Advanced Stroboscopic Event Detection in Semiconductor Wafer Polishing
StroboX’s advanced technology, capable of identifying multiple stroboscopic events within the same image, provides a significant advantage in semiconductor wafer polishing. This capability allows for the simultaneous detection of various types of defects and irregularities across the wafer surface in real-time.
High-Speed Paint and Coating Application Inspection
StroboX utilizes AI and stroboscopic technology to automate the inspection of high-speed paint and coating application lines. It synchronizes with application speeds to capture clear images and detect defects in real-time.
High-Speed Genetic Analysis and Sequencing Monitoring
StroboX leverages AI and stroboscopic technology to automate the monitoring of genetic analysis and sequencing processes in real-time. It can capture multiple stroboscopic events to detect various issues simultaneously.
High-Speed Semiconductor Manufacturing Inspection
StroboX leverages AI and stroboscopic technology to automate the inspection of high-speed semiconductor manufacturing processes. It synchronizes with production speeds to capture clear, high-resolution images and detect defects in real-time.